Thermal conductivity of semiconductor superlattices: Experimental study of interface scattering

Details Thermal conductivity of semiconductor superlattices: Experimental study of interface scattering Thermal conductivity of semiconductor superlattices: Experimental study of interface scattering

2009-10-07

arxiv.org/abs/0910.1208v1

Physical Review B (Condensed Matter and Materials Physics) 79, 15 (2009) 153304

Physics

Condensed Matter

Materials Science

Scientific paper

10.1103/PhysRevB.79.153304

We present thermal conductivity measurements performed in three short-period (GaAs)_9(AlAs)_5 superlattices. The samples were grown at different temperatures, leading to different small scale roughness and broadening of the interfaces. The cross-plane conductivity is measured with a differential 3w method, at room temperature. The order of magnitude of the overall thermal conductivity variation is consistent with existing theoretical models, although the actual variation is smaller than expected.

Affiliated with

Also associated with

No associations

Rating

Thermal conductivity of semiconductor superlattices: Experimental study of interface scattering does not yet have a rating. At this time, there are no reviews or comments for this scientific paper.

If you have personal experience with Thermal conductivity of semiconductor superlattices: Experimental study of interface scattering, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Thermal conductivity of semiconductor superlattices: Experimental study of interface scattering will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFWR-SCP-O-35900