Physics – Condensed Matter – Materials Science
Scientific paper
2010-05-27
J. Phys. D: Appl. Phys. 43 (2010) 133001
Physics
Condensed Matter
Materials Science
Topical review, 26 pages
Scientific paper
10.1088/0022-3727/43/13/133001
The epitaxial growth of complex oxide thin films provide three avenues to generate unique properties: the ability to influence the 3-dimensional structure of the film, the presence of a surface, and the generation of an interface. In all three cases, a clear understanding of the resulting atomic structure is desirable. However, determining the full structure of an epitaxial thin film (lattice parameters, space group, atomic positions, surface reconstructions) on a routine basis is a serious challenge. In this paper we highlight the remarkable information that can be extracted from both the Bragg scattering and inelastic multiple scattering events that occur during Reflection High Energy Electron Diffraction. We review some methods to extract structural information and show how mature techniques used in other fields can be directly applied to the {\em in-situ} and real-time diffraction images of a growing film. These collection of techniques give access to both the epitaxially influenced 3 dimensional bulk structure of the film, and any reconstructions that may happen at the surface.
Ingle N. J. C.
Leung S.
Paul Mark
Wicks R.
Yuskauskas A.
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