Physics – Condensed Matter – Materials Science
Scientific paper
2007-05-19
Physics
Condensed Matter
Materials Science
Submitted to Appl. Phys. Lett
Scientific paper
10.1063/1.2784199
We establish a correlation between the internal stress in InN epilayers and their optical properties such as the measured absorption band edge and photoluminescence emission wavelength. By a careful evaluation of the lattice constants of InN epilayers grown on c-plane sapphire substrates under various conditions by metalorganic vapor phase epitaxy we find that the films are under primarily hydrostatic stress. This results in a shift in the band edge to higher energy. The effect is significant, and may be responsible for some of the variations in InN bandgap reported in the literature.
Arora B. M.
Bhattacharya Arnab
Ganguli Tapas
Ghosh Sandip
Gokhale M. R.
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