The method of non-linear distortions elimination in photoacoustic investigation of layered semiconductor structure

Details The method of non-linear distortions elimination in photoacoustic investigation of layered semiconductor structure The method of non-linear distortions elimination in photoacoustic investigation of layered semiconductor structure

2007-09-12

arxiv.org/abs/0709.1870v1

Dans Proceedings of 12th International Workshop on Thermal investigations of ICs - THERMINIC 2006, Nice : France (2006)

Physics

Condensed Matter

Materials Science

Submitted on behalf of TIMA Editions (http://irevues.inist.fr/tima-editions)

Scientific paper

This paper presents the consideration of the presence and the influence of
non-linear distortion of photo-acoustic measurement set-up on the results of
thermal properties analysis for the multi-layer semiconductor structure. The
authors propose a method which will eliminate such an influence.

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