The development and applications of ultrafast electron nanocrystallography

Physics – Condensed Matter – Mesoscale and Nanoscale Physics

Scientific paper

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

33 pages, 17 figures (Review article, 2008 conference of ultrafast electron microscopy conference and ultrafast sciences)

Scientific paper

We review the development of ultrafast electron nanocrystallography as a method for investigating structural dynamics for nanoscale materials and interfaces. Its sensitivity and resolution are demonstrated in the studies of surface melting of gold nanocrystals, nonequilibrium transformation of graphite into reversible diamond-like intermediates, and molecular scale charge dynamics, showing a versatility for not only determining the structures, but also the charge and energy redistribution at interfaces. A quantitative scheme for three-dimensional retrieval of atomic structures is demonstrated with few-particle (< 1000) sensitivity, establishing this nanocrystallographic method as a tool for directly visualizing dynamics within isolated nanomaterials with atomic scale spatio-temporal resolution.

No associations

LandOfFree

Say what you really think

Search LandOfFree.com for scientists and scientific papers. Rate them and share your experience with other people.

Rating

The development and applications of ultrafast electron nanocrystallography does not yet have a rating. At this time, there are no reviews or comments for this scientific paper.

If you have personal experience with The development and applications of ultrafast electron nanocrystallography, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and The development and applications of ultrafast electron nanocrystallography will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFWR-SCP-O-423050

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.