The application of Artificial Neural Network for the assessment of thermal properties of multi-layer semiconductor structure

Details The application of Artificial Neural Network for the assessment of thermal properties of multi-layer semiconductor structure The application of Artificial Neural Network for the assessment of thermal properties of multi-layer semiconductor structure

2007-09-12

arxiv.org/abs/0709.1866v1

Dans Proceedings of 12th International Workshop on Thermal investigations of ICs - THERMINIC 2006, Nice : France (2006)

Physics

Condensed Matter

Materials Science

Submitted on behalf of TIMA Editions (http://irevues.inist.fr/tima-editions)

Scientific paper

In this paper, the solution of the problem of identification of thermal
properties of investigated multi-layer structure is presented. In order of
that, artificial neural network was used to find the set of thermal properties
for which the complex contrast characteric derived fits the best to the one
evaluated basing upon experimenatal data.

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