Temporal universal conductance fluctuations in RuO$_2$ nanowires due to mobile defects

Details Temporal universal conductance fluctuations in RuO$_2$ nanowires due to mobile defects Temporal universal conductance fluctuations in RuO$_2$ nanowires due to mobile defects

2011-09-27

arxiv.org/abs/1109.5848v1

Phys. Rev. B 84, 155432 (2011)

Physics

Condensed Matter

Mesoscale and Nanoscale Physics

5 pages, 3 figures

Scientific paper

10.1103/PhysRevB.84.155432

Temporal universal conductance fluctuations (TUCF) are observed in RuO$_2$ nanowires at cryogenic temperatures. The fluctuations persist up to very high $T \sim 10$ K. Their root-mean-square magnitudes increase with decreasing $T$, reaching $\sim 0.2 e^2/h$ at $T \lesssim 2$ K. These fluctuations are shown to originate from scattering of conduction electrons with rich amounts of mobile defects in artificially synthesized metal oxide nanowires. TUCF characteristics in both one-dimensional saturated and unsaturated regimes are identified and explained in terms of current theories. Furthermore, the TUCF as a probe for the characteristic time scales of the mobile defects (two-level systems) are discussed.

Affiliated with

Also associated with

No associations

Rating

Temporal universal conductance fluctuations in RuO$_2$ nanowires due to mobile defects does not yet have a rating. At this time, there are no reviews or comments for this scientific paper.

If you have personal experience with Temporal universal conductance fluctuations in RuO$_2$ nanowires due to mobile defects, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Temporal universal conductance fluctuations in RuO$_2$ nanowires due to mobile defects will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFWR-SCP-O-62660