Temperature Control of Electromigration to form Gold Nanogap Junctions

Details Temperature Control of Electromigration to form Gold Nanogap Junctions Temperature Control of Electromigration to form Gold Nanogap Junctions

2005-11-15

arxiv.org/abs/cond-mat/0511382v1

Applied Physics Letters 87 263101 (2005)

Physics

Condensed Matter

Mesoscale and Nanoscale Physics

14 pages,5 figures

Scientific paper

10.1063/1.2149174

Controlled electromigration of gold nanowires of different cross-sectional areas to form nanogap junctions is studied using a feedback method. A linear correlation between the cross sectional area of the gold nanowires and the power dissipated in the junction during electromigration is observed, indicating that the feedback mechanism operates primarily by controlling the temperature of the junction during electromigration. We also show that the role of the external feedback circuit is to prevent thermal runaway; minimization of series resistance allows controlled electromigration to a significant range of junction resistances with a simple voltage ramp.

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