Physics – Condensed Matter – Materials Science
Scientific paper
1998-11-11
IEEE Trans. Appl. Supercond. 9, 4127 (1999)
Physics
Condensed Matter
Materials Science
6 pages with 9 figures, Proceedings of the Applied Superconductivity Conference 1998
Scientific paper
We have developed scanning near-field microwave microscopes which can image electrodynamic properties of superconducting materials on length scales down to about 2 $\mu$m. The microscopes are capable of quantitative imaging of sheet resistance of thin films, and surface topography. We demonstrate the utility of the microscopes through images of the sheet resistance of a YBa2Cu3O7-d thin film wafer, images of bulk Nb surfaces, and spatially resolved measurements of Tc of a YBa2Cu3O7-d thin film. We also discuss some of the limitations of the microscope and conclude with a summary of its present capabilities.
Anlage Steven M.
Dutta Sudeep K.
Feenstra B. J.
Hu Wensheng
Steinhauer D. E.
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