Study of the Magnetic Film Materials by Horizontal Scanning Mode for the Magnetic Force Microscopy in Magnetostatic and ac Regimes

Details Study of the Magnetic Film Materials by Horizontal Scanning Mode for the Magnetic Force Microscopy in Magnetostatic and ac Regimes Study of the Magnetic Film Materials by Horizontal Scanning Mode for the Magnetic Force Microscopy in Magnetostatic and ac Regimes

2006-11-02

arxiv.org/abs/cond-mat/0611060v1

Physics

Condensed Matter

Other Condensed Matter

7 pages, 6 figures

Scientific paper

The magnetic force microscopy inverse problem for the case of horizontal scanning of a tip on a linear magnetic film is introduced. We show the possibility to recover the magnetic permeability of the material from the experimental data by using the Hankel (Fourier-Bessel) transform inverse method (HIM). This method is applied to the case of a layered slab film as well. The inverse problem related to the ac MFM is introduced.

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