Physics – Condensed Matter – Materials Science
Scientific paper
2010-06-24
JOURNAL OF APPLIED PHYSICS 105, 014101 (2009)
Physics
Condensed Matter
Materials Science
14 Pages and 6 figures
Scientific paper
Thin films of (1-x)BiFeO3-xPbTiO3 (BF-xPT) with x ~ 0.60 were fabricated on Pt/Si substrates by chemical solution deposition of precursor BF and PT layers alternately in three different multilayer configurations. These multilayer deposited precursor films upon annealing at 700{\deg}C in nitrogen show pure perovskite phase formation. In contrast to the equilibrium tetragonal structure for the overall molar composition of BF:PT::40:60, we find monoclinic structured BF-xPT phase of MA type. Piezo-force microscopy confirmed ferroelectric switching in the films and revealed different normal and lateral domain distributions in the samples. Room temperature electrical measurements show good quality ferroelectric hysteresis loops with remanent polarization, Pr, of up to 18 {\mu}C/cm2 and leakage currents as low as 10-7 A/cm2.
Agrawal Dinesh Chandra
Bhattacharjee Shuvrajyoti
Garg Ashish
Gupta Shashaank
Pandey Dhananjai
No associations
LandOfFree
Structural Changes and Ferroelectric Properties of BiFeO<sub>3</sub>-PbTiO<sub>3</sub> Thin Films Grown via a Chemical Multilayer Deposition Method does not yet have a rating. At this time, there are no reviews or comments for this scientific paper.
If you have personal experience with Structural Changes and Ferroelectric Properties of BiFeO<sub>3</sub>-PbTiO<sub>3</sub> Thin Films Grown via a Chemical Multilayer Deposition Method, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Structural Changes and Ferroelectric Properties of BiFeO<sub>3</sub>-PbTiO<sub>3</sub> Thin Films Grown via a Chemical Multilayer Deposition Method will most certainly appreciate the feedback.
Profile ID: LFWR-SCP-O-674940