Strong Anomalous Optical Dispersion of Graphene: Complex Refractive Index Measured by Picometrology

Details Strong Anomalous Optical Dispersion of Graphene: Complex Refractive Index Measured by Picometrology Strong Anomalous Optical Dispersion of Graphene: Complex Refractive Index Measured by Picometrology

2008-11-07

arxiv.org/abs/0811.1210v1

Optics Express Vol. 16, Iss. 26, pp. 22105 - 22112 (2008)

Physics

Condensed Matter

Materials Science

Scientific paper

We apply spinning-disc picometrology to measure the complex refractive index
of graphene on thermal oxide on silicon. The refractive index varies from n =
2.4-1.0i at 532 nm to n = 3.0-1.4i at 633 nm at room temperature. The
dispersion is five times stronger than bulk graphite (2.67-1.34i to 2.73-1.42i
from 532 nm to 633 nm).

Affiliated with

Also associated with

No associations

Rating

Strong Anomalous Optical Dispersion of Graphene: Complex Refractive Index Measured by Picometrology does not yet have a rating. At this time, there are no reviews or comments for this scientific paper.

If you have personal experience with Strong Anomalous Optical Dispersion of Graphene: Complex Refractive Index Measured by Picometrology, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Strong Anomalous Optical Dispersion of Graphene: Complex Refractive Index Measured by Picometrology will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFWR-SCP-O-245340