Spatially Resolved Raman Spectroscopy of Single- and Few-Layer Graphene

Details Spatially Resolved Raman Spectroscopy of Single- and Few-Layer Graphene Spatially Resolved Raman Spectroscopy of Single- and Few-Layer Graphene

2006-07-21

arxiv.org/abs/cond-mat/0607562v1

Nano Lett. 7, 238 (2007)

Physics

Condensed Matter

Mesoscale and Nanoscale Physics

Scientific paper

We present Raman spectroscopy measurements on single- and few-layer graphene flakes. Using a scanning confocal approach we collect spectral data with spatial resolution, which allows us to directly compare Raman images with scanning force micrographs. Single-layer graphene can be distinguished from double- and few-layer by the width of the D' line: the single peak for single-layer graphene splits into different peaks for the double-layer. These findings are explained using the double-resonant Raman model based on ab-initio calculations of the electronic structure and of the phonon dispersion. We investigate the D line intensity and find no defects within the flake. A finite D line response originating from the edges can be attributed either to defects or to the breakdown of translational symmetry.

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