Physics – Condensed Matter
Scientific paper
1995-12-18
Physics
Condensed Matter
11 pages, 4 postscript figures, submitted to Phys Rev B15, Rapid Communications
Scientific paper
10.1103/PhysRevB.53.R8824
Soft x-ray fluorescence spectroscopy has been employed to obtain information about the Si-derived valence band states of Fe/Si multilayers. The valence band spectra are quite different for films with and without antiferromagnetic interlayer exchange coupling, demonstrating that these multilayers have different silicide phases in their spacer layers. Comparison with previously published fluorescence data on bulk iron silicides shows that the Fe concentration in the silicide spacer layers is substantial. Near-edge x-ray absorption data on antiferromagnetically coupled multilayers in combination with the fluorescence data demonstrate unambiguously that the silicide spacer layer in these films is metallic. These results on the electronic structure of buried layers in a multilayer film exemplify the wide range of experiments made possible by new high-brightness synchrotron sources.
Callcott T. A.
Carlisle J. A.
Chaiken Andrew
Ederer David L.
Jia Jianjun
No associations
LandOfFree
Soft X-ray Fluorescence Study of Buried Silicides in Antiferromagnetically Coupled Fe/Si Multilayer does not yet have a rating. At this time, there are no reviews or comments for this scientific paper.
If you have personal experience with Soft X-ray Fluorescence Study of Buried Silicides in Antiferromagnetically Coupled Fe/Si Multilayer, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Soft X-ray Fluorescence Study of Buried Silicides in Antiferromagnetically Coupled Fe/Si Multilayer will most certainly appreciate the feedback.
Profile ID: LFWR-SCP-O-675402