Single-Electron Traps: A Quantitative Comparison of Theory and Experiment

Details Single-Electron Traps: A Quantitative Comparison of Theory and Experiment Single-Electron Traps: A Quantitative Comparison of Theory and Experiment

1996-09-27

arxiv.org/abs/cond-mat/9609273v1

Physics

Condensed Matter

17 pages, 21 figures, RevTex, epsf

Scientific paper

10.1063/1.364278

We have carried out a coordinated experimental and theoretical study of single-electron traps based on submicron aluminum islands and aluminum oxide tunnel junctions. The results of geometrical modeling using a modified version of MIT's FastCap were used as input data for the general-purpose single-electron circuit simulator MOSES. The analysis indicates reasonable quantitative agreement between theory and experiment for those trap characteristics which are not affected by random offset charges. The observed differences between theory and experiment (ranging from a few to fifty percent) can be readily explained by the uncertainty in the exact geometry of the experimental nanostructures.

Affiliated with

Also associated with

No associations

Rating

Single-Electron Traps: A Quantitative Comparison of Theory and Experiment does not yet have a rating. At this time, there are no reviews or comments for this scientific paper.

If you have personal experience with Single-Electron Traps: A Quantitative Comparison of Theory and Experiment, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Single-Electron Traps: A Quantitative Comparison of Theory and Experiment will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFWR-SCP-O-245506