Simultaneous current-, force- and work function measurement with atomic resolution

Details Simultaneous current-, force- and work function measurement with atomic resolution Simultaneous current-, force- and work function measurement with atomic resolution

2005-01-19

arxiv.org/abs/cond-mat/0501469v1

Appl. Phys. Lett. 86, 153101 (2005)

Physics

Condensed Matter

Materials Science

8 pages, 4 figures, submitted to Applied Physics Letters

Scientific paper

10.1063/1.1900316

The local work function of a surface determines the spatial decay of the charge density at the Fermi level normal to the surface. Here, we present a method that enables simultaneous measurements of local work function and tip-sample forces. A combined dynamic scanning tunneling microscope and atomic force microscope is used to measure the tunneling current between an oscillating tip and the sample in real time as a function of the cantilever's deflection. Atomically resolved work function measurements on a silicon (111)-($7\times 7$) surface are presented and related to concurrently recorded tunneling current- and force- measurements.

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