Shot-noise-driven escape in hysteretic Josephson junctions

Details Shot-noise-driven escape in hysteretic Josephson junctions Shot-noise-driven escape in hysteretic Josephson junctions

2005-02-18

arxiv.org/abs/cond-mat/0502446v1

Physics

Condensed Matter

Mesoscale and Nanoscale Physics

Scientific paper

10.1103/PhysRevLett.95.197004

We have measured the influence of shot noise on hysteretic Josephson junctions initially in macroscopic quantum tunnelling (MQT) regime. Escape threshold current into the resistive state decreases monotonically with increasing average current through the scattering conductor, which is another tunnel junction. Escape is predominantly determined by excitation due to the wide-band shot noise. This process is equivalent to thermal activation (TA) over the barrier at temperatures up to about four times above the critical temperature of the superconductor. The presented TA model is in excellent agreement with the experimental results.

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