Short range attraction between two similarly charged silica surfaces

Details Short range attraction between two similarly charged silica surfaces Short range attraction between two similarly charged silica surfaces

2005-12-26

arxiv.org/abs/cond-mat/0512651v1

Physics

Condensed Matter

Soft Condensed Matter

Scientific paper

10.1103/PhysRevLett.96.177802

Using an Atomic Force Microscope (AFM) we measure the interaction between two identically charged silica surfaces in the presence of saline solution. For pure NaCl the interaction is always repulsive. Upon addition of cobalt hexamine ions, [Co(NH3)6]+3, the repulsion is gradually suppressed and a pronounced attraction develops at distances much shorter than the screening length. Higher concentrations of cobalt hexamine turn the attraction back into repulsion. Measurements of surface charge renormalization by the three valent cations provide their surface density and their association constant to the negatively charged silica surface. These estimates exclude interaction between two condensed Wigner crystals as an explanation for the attraction.

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