Self-organized criticality in the Bean state in YBa$_2$Cu$_3$O$_{7-x}$ thin films

Details Self-organized criticality in the Bean state in YBa$_2$Cu$_3$O$_{7-x}$ thin films Self-organized criticality in the Bean state in YBa$_2$Cu$_3$O$_{7-x}$ thin films

2003-05-26

arxiv.org/abs/cond-mat/0305591v1

Physics

Condensed Matter

Soft Condensed Matter

4 pages, 4 figures, submitted to PRL

Scientific paper

The penetration of magnetic flux into a thin film of YBa$_2$Cu$_3$O$_{7-x}$ is studied when the external field is ramped slowly. In this case the flux penetrates in bursts or avalanches. The size of these avalanches is distributed according to a power law with an exponent of $\tau$ = 1.29(2). The additional observation of finite-size scaling of the avalanche distributions, with an avalanche dimension D = 1.89(3), gives strong indications towards self-organized criticality in this system. Furthermore we determine exponents governing the roughening dynamics of the flux surface using some universal scaling relations. These exponents are compared to those obtained from a standard roughening analysis.

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