Self-navigation of STM tip toward a micron sized sample

Details Self-navigation of STM tip toward a micron sized sample Self-navigation of STM tip toward a micron sized sample

2011-04-21

arxiv.org/abs/1104.4170v1

Rev. Sci. Instrum. 82, 073501 (2011)

Physics

Condensed Matter

Mesoscale and Nanoscale Physics

11 pages, 4 figures

Scientific paper

10.1063/1.3605485

We demonstrate a simple capacitive based method to quickly and efficiently locate micron size conductive samples on insulating substrates in a scanning tunneling microscope (STM). By using edge recognition the method is designed to locate and identify small features when the STM tip is far above the surface allowing for crash-free search and navigation. The method can be implemented in any STM environment even at low temperatures and in strong magnetic field, with minimal or no hardware modifications.

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