Scanning tunneling spectroscopy characterization of the pseudogap and the x = 1/8 anomaly in La2-xSrxCuO4 thin films

Details Scanning tunneling spectroscopy characterization of the pseudogap and the x = 1/8 anomaly in La2-xSrxCuO4 thin films Scanning tunneling spectroscopy characterization of the pseudogap and the x = 1/8 anomaly in La2-xSrxCuO4 thin films

2007-07-04

arxiv.org/abs/0707.0551v1

Physical Review B 75, 184521 (2007)

Physics

Condensed Matter

Superconductivity

15 pages, 6 figures

Scientific paper

10.1103/PhysRevB.75.184521

Using scanning tunneling spectroscopy we examined the local density of states of thin c-axis La2-xSrxCuO4 films, over wide doping and temperature ranges. We found that the pseudogap exists only at doping levels lower than optimal. For x = 0.12, close to the 'anomalous' x = 1/8 doping level, a zero bias conductance peak was the dominant spectral feature, instead of the excepted V- shaped (c-axis tunneling) gap structure. We have established that this surprising effect cannot be explained by tunneling into (110) facets. Possible origins for this unique behavior are discussed.

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