Scanning Tunneling Microscopy currents on locally disordered graphene

Details Scanning Tunneling Microscopy currents on locally disordered graphene Scanning Tunneling Microscopy currents on locally disordered graphene

2009-04-21

arxiv.org/abs/0904.3189v1

Phys. Rev. B 79, 155442 (2009)

Physics

Condensed Matter

Mesoscale and Nanoscale Physics

Accepted in PRB

Scientific paper

10.1103/PhysRevB.79.155442

We study the local density of states at and around a substituting impurity and use these results to compute current versus bias characteristic curves of Scanning Tunneling Microscopy (STM) experiments done on the surface of graphene. This allow us to detect the presence of substituting impurities on graphene. The case of vacancies is also analyzed. We find that the shape and magnitude of the STM characteristic curves depend on the position of the tip and on the nature of the defect, with the strength of the binging between the impurity and the carbon atoms playing an important role. Also the nature of the last atom of the tip has an influence on the shape of the characteristic curve.

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