Scanning microscopies of superconductors at very low temperatures

Details Scanning microscopies of superconductors at very low temperatures Scanning microscopies of superconductors at very low temperatures

2012-01-09

arxiv.org/abs/1201.1868v1

Physics

Condensed Matter

Superconductivity

Scientific paper

We discuss basics of scanning tunneling microscopy and spectroscopy (STM/S) of the superconducting state with normal and superconducting tips. We present a new method to measure the local variations in the Andreev reflection amplitude between a superconducting tip and the sample. This method is termed Scanning Andreev Reflection Spectroscopy (SAS). We also briefly discuss vortex imaging with STM/S under an applied current through the sample, and show the vortex lattice as a function of the angle between the magnetic field and sample's surface.

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