Scanning gate microscopy of current-annealed single layer graphene

Details Scanning gate microscopy of current-annealed single layer graphene Scanning gate microscopy of current-annealed single layer graphene

2009-11-19

arxiv.org/abs/0911.3832v2

Appl. Phys. Lett. 96, 113501 (2010)

Physics

Condensed Matter

Mesoscale and Nanoscale Physics

8 pages, 4 figures

Scientific paper

10.1063/1.3327829

We have used scanning gate microscopy to explore the local conductivity of a current-annealed graphene flake. A map of the local neutrality point (NP) after annealing at low current density exhibits micron-sized inhomogeneities. Broadening of the local e-h transition is also correlated with the inhomogeneity of the NP. Annealing at higher current density reduces the NP inhomogeneity, but we still observe some asymmetry in the e-h conduction. We attribute this to a hole doped domain close to one of the metal contacts combined with underlying striations in the local NP.

Affiliated with

Also associated with

No associations

Rating

Scanning gate microscopy of current-annealed single layer graphene does not yet have a rating. At this time, there are no reviews or comments for this scientific paper.

If you have personal experience with Scanning gate microscopy of current-annealed single layer graphene, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Scanning gate microscopy of current-annealed single layer graphene will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFWR-SCP-O-453662