Scanned Probe Microscopy of Electronic Transport in Carbon Nanotubes

Details Scanned Probe Microscopy of Electronic Transport in Carbon Nanotubes Scanned Probe Microscopy of Electronic Transport in Carbon Nanotubes

2000-02-14

arxiv.org/abs/cond-mat/0002209v1

Physics

Condensed Matter

Mesoscale and Nanoscale Physics

4 pages

Scientific paper

10.1103/PhysRevLett.84.6082

We use electrostatic force microscopy and scanned gate microscopy to probe the conducting properties of carbon nanotubes at room temperature. Multi-walled carbon nanotubes are shown to be diffusive conductors, while metallic single-walled carbon nanotubes are ballistic conductors over micron lengths. Semiconducting single-walled carbon nanotubes are shown to have a series of large barriers to conduction along their length. These measurements are also used to probe the contact resistance and locate breaks in carbon nanotube circuits.

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