Scanned Potential Microscopy of Edge States in a Quantum Hall Liquid

Physics – Condensed Matter – Mesoscale and Nanoscale Physics

Scientific paper

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Details

4 pages, 4 figs. To be published in Physica E (Proceedings of the 13th International Conference on the Properties of 2D System

Scientific paper

10.1016/S1386-9477(99)00115-0

Using a low-temperature atomic force microscope as a local voltmeter, we
measure the Hall voltage profile in a quantum Hall conductor in the presence of
a gate-induced non-equilibrium edge state population at n=3. We observe sharp
voltage drops at the sample edges which are suppressed by re-equilibrating the
edge states.

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