Scaling of the Coercive Field with Thickness in Thin-Film Ferroelectrics

Details Scaling of the Coercive Field with Thickness in Thin-Film Ferroelectrics Scaling of the Coercive Field with Thickness in Thin-Film Ferroelectrics

2003-10-03

arxiv.org/abs/cond-mat/0310074v1

Physics

Condensed Matter

Materials Science

Contribution for Proceedings of EMF 2003 (Cambridge, UK)

Scientific paper

Motivated by the observed thickness-scaling of the coercive field in ferroelectric films over five decades, we develop a statistical approach towards understanding the conceptual underpinnings of this behavior. Here the scaling exponent is determined by the field-dependence of a known and measured quantity, the nucleation rate per unit area. We end with a discussion of our initial assumptions and point to instances where they could no longer be applicable.

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