Physics – Condensed Matter
Scientific paper
1994-12-22
Physics
Condensed Matter
uuencoded compressed ps-file. To be published in PRB
Scientific paper
We have studied the temperature dependence of resistivity, $\rho$, for a two-dimensional electron system in silicon at low electron densities, $n_s\sim10^{11}$ cm$^{-2}$, near the metal/insulator transition. The resistivity was empirically found to scale with a single parameter, $T_0$, which approaches zero at some critical electron density, $n_c$, and increases as a power $T_0\propto|n_s-n_c|^\beta$ with $\beta=1.6\pm0.1$ both in metallic ($n_s>n_c$) and insulating ($n_s
Bowker G. E.
D'Iorio M.
Furneaux J. E.
Kravchenko S. V.
Mason Whitney E.
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