Physics – Condensed Matter – Mesoscale and Nanoscale Physics
Scientific paper
2002-09-04
Physics
Condensed Matter
Mesoscale and Nanoscale Physics
to appear in Physical Review Letters
Scientific paper
10.1103/PhysRevLett.89.216801
The influence of defects on electron transport in single-wall carbon nanotube field effect transistors (CNFETs) is probed by combined scanning gate microscopy (SGM) and scanning impedance microscopy (SIM). SGM reveals a localized field effect at discrete defects along the CNFET length. The depletion surface potential of individual defects is quantified from the SGM-imaged radius of the defect as a function of tip bias voltage. This provides a measure of the Fermi level at the defect with zero tip voltage, which is as small as 20 meV for the strongest defects. The effect of defects on transport is probed by SIM as a function of backgate and tip-gate voltage. When the backgate voltage is set so the CNFET is "on" (conducting), SIM reveals a uniform potential drop along its length, consistent with diffusive transport. In contrast, when the CNFET is "off", potential steps develop at the position of depleted defects. Finally, high-resolution imaging of a second set of weak defects is achieved in a new "tip-gated" SIM mode.
Bonnell Dawn A.
Freitag Marcus
Johnson Alan T.
Kalinin Sergei V.
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