Resonant Behavior in the Projectile X-Ray Yield Associated with Electron Capture in S + Ar Collisions

Details Resonant Behavior in the Projectile X-Ray Yield Associated with Electron Capture in S + Ar Collisions Resonant Behavior in the Projectile X-Ray Yield Associated with Electron Capture in S + Ar Collisions

Nov 1982

adsabs.harvard.edu/cgi-bin/nph-data_query?bibcode=1982phrvl..49.1325t&link_type=abstract

Physical Review Letters, Volume 49, Issue 18, November 1, 1982, pp.1325-1328

Physics

92

Charge Transfer, X-Ray Spectra, Stellar Atmospheres, Radiative Transfer, Opacity And Line Formation

Scientific paper

Experimental evidence is presented for a new resonant process in ion-atom collisions which is analogous to dielectronic recombination in free-electron-ion collisions. Resonant behavior observed in the yield of projectile K x rays in coincidence with single-electron capture in 70-160-MeV S + Ar collisions is attributed to simultaneous electron capture and K-shell excitation. The data indicate that this resonant process is an important mechanism in inner-shell vacancy production in the energy range studied.

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