Resolution Function Theory in Piezoresponse Force Microscopy: Domain Wall Profile, Spatial Resolution, and Tip Calibration

Details Resolution Function Theory in Piezoresponse Force Microscopy: Domain Wall Profile, Spatial Resolution, and Tip Calibration Resolution Function Theory in Piezoresponse Force Microscopy: Domain Wall Profile, Spatial Resolution, and Tip Calibration

2006-08-12

arxiv.org/abs/cond-mat/0608289v1

Physics

Condensed Matter

Materials Science

76 pages, 18 figures, 3 Appendices, submitted to Phys. Rev. B

Scientific paper

Piezoresponse Force Microscopy (PFM) has emerged as a primary tool for imaging, domain engineering, and switching spectroscopy on ferroelectric materials. Quantitative interpretation of PFM data including measurements of the intrinsic width of the domain walls, geometric parameters of the domain below the tip in local hysteresis loop measurements, as well as interpretation of switching and coercive biases in terms of materials properties and switching mechanisms, requires reliable knowledge on electrostatic field structure produced by the tip. Using linear imaging theory, we develop a theoretical approach for interpretation of these measurements and determination of tip parameters from a calibration standard. The resolution and object transfer functions in PFM are derived and effect of materials parameters on resolution is determined. Closed form solutions for domain wall profiles in vertical and lateral PFM and signal from cylindrical domain in transversally isotropic piezoelectric are derived for point-charge and sphere-plane geometry of the tip.

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