Refractive index of vanadium determined by resonant diffraction of soft x-rays

Details Refractive index of vanadium determined by resonant diffraction of soft x-rays Refractive index of vanadium determined by resonant diffraction of soft x-rays

2011-12-30

arxiv.org/abs/1201.0109v1

Journal of Electron Spectroscopy and Related Phenomena 137-140 519-522 (2004)

Physics

Condensed Matter

Materials Science

7 pages, 3 figures, http://www.sciencedirect.com/science/article/pii/S0368204804001264

Scientific paper

10.1016/j.elspec.2004.02.103

The dispersive part of the refractive index of vanadium is determined by measuring the angular displacement of the first order diffraction peak of a V/Fe superlattice. The measurements were made using elliptically polarized synchrotron radiation which was scanned through the V L2,3 absorption edges for different incident scattering angles. The x-ray scattering technique provides access to direct determination of the dispersive part of the refractive index through an absorption resonance. The influence of absorption at the resonances is shown by comparing the absorption correction to the dispersion correction. The results demonstrate that 1-{\delta} is larger than unity at the L2,3 resonances of vanadium and the optical consequences are discussed.

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