Reduced leakage current in Josephson tunnel junctions with codeposited barriers

Details Reduced leakage current in Josephson tunnel junctions with codeposited barriers Reduced leakage current in Josephson tunnel junctions with codeposited barriers

2008-12-18

arxiv.org/abs/0812.3636v3

Appl. Phys. Lett. 97, 233510 (2010)

Physics

Condensed Matter

Superconductivity

3 pages, 4 figures

Scientific paper

10.1063/1.3518983

Josephson junctions were fabricated using two different methods of barrier formation. The trilayers employed were Nb/Al-AlOx/Nb on sapphire, where the first two layers were epitaxial. The oxide barrier was formed either by exposing the Al surface to O2 or by codepositing Al in an O2 background. The codeposition process yielded junctions that showed the theoretically predicted subgap current and no measurable shunt conductance. In contrast, devices with barriers formed by thermal oxidation showed a small shunt conductance in addition to the predicted subgap current.

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