Raman microspectroscopic characterization of amorphous silica plastic behavior

Details Raman microspectroscopic characterization of amorphous silica plastic behavior Raman microspectroscopic characterization of amorphous silica plastic behavior

2004-09-28

arxiv.org/abs/cond-mat/0409726v2

Journal of the American Ceramic Society 89 (2006) 596

Physics

Condensed Matter

Other Condensed Matter

Scientific paper

Raman microspectroscopy was used to characterize amorphous silica plastic behavior. Using a correlation between Raman spectrum and density, a map of the local residual indentation-induced densification is obtained. The existence of a densification-induced hardening is also evidenced through a diamond anvil cell experiment. Such observations are not accounted for by the previously proposed hardening-free pressure-dependent yield criterion based on indentation curves. These results open the way to more accurate description of a constitutive law for amorphous silica.

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