Quasistatic x-ray speckle metrology of microscopic magnetic return point memory

Details Quasistatic x-ray speckle metrology of microscopic magnetic return point memory Quasistatic x-ray speckle metrology of microscopic magnetic return point memory

2004-11-28

arxiv.org/abs/cond-mat/0411695v1

Physical Review Letters 90, 175502 (2003)

Physics

Condensed Matter

Other Condensed Matter

5 pages, 4 figures

Scientific paper

10.1103/PhysRevLett.90.175502

We have used coherent, resonant, x-ray magnetic speckle patterns to measure the statistical evolution of the microscopic magnetic domains in perpendicular magnetic films as a function of the applied magnetic field. Our work constitutes the first direct, ensemble-averaged study of microscopic magnetic return point memory, and demonstrates the profound impact of interfacial roughness on this phenomenon. At low fields, the microscopic magnetic domains forget their past history with an exponential field dependence.

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