Quantum Shuttle Phenomena in a Nanoelectromechanical Single-Electron Transistor

Physics – Condensed Matter – Mesoscale and Nanoscale Physics

Scientific paper

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

5 pages, 1 figure

Scientific paper

10.1103/PhysRevLett.92.166801

An analytical analysis of quantum shuttle phenomena in a nanoelectromechanical single-electron transistor has been performed in the realistic case, when the electron tunnelling length is much greater than the amplitude of the zero point oscillations of the central island. It is shown that when the dissipation is below a certain threshold value, the vibrational ground state of the central island is unstable. The steady-state into which this instability develops is studied. It is found that if the electric field ${\cal E}$ between the leads is much greater than a characteristic value ${\cal E}_q$, the quasiclassical shuttle picture is recovered, while if ${\cal E}\ll{\cal E}_q$ a new quantum regime of shuttle vibrations occurs. We show that in the latter regime small quantum fluctuations result in large (i.e. finite in the limit $\hbar \to 0$) shuttle vibrations.

No associations

LandOfFree

Say what you really think

Search LandOfFree.com for scientists and scientific papers. Rate them and share your experience with other people.

Rating

Quantum Shuttle Phenomena in a Nanoelectromechanical Single-Electron Transistor does not yet have a rating. At this time, there are no reviews or comments for this scientific paper.

If you have personal experience with Quantum Shuttle Phenomena in a Nanoelectromechanical Single-Electron Transistor, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Quantum Shuttle Phenomena in a Nanoelectromechanical Single-Electron Transistor will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFWR-SCP-O-627892

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.