Quantum dot-cavity strong-coupling regime measured through coherent reflection spectroscopy in a very high-Q micropillar

Details Quantum dot-cavity strong-coupling regime measured through coherent reflection spectroscopy in a very high-Q micropillar Quantum dot-cavity strong-coupling regime measured through coherent reflection spectroscopy in a very high-Q micropillar

2010-11-04

arxiv.org/abs/1011.1155v1

Physics

Condensed Matter

Mesoscale and Nanoscale Physics

Scientific paper

We report on the coherent reflection spectroscopy of a high-quality factor micropillar, in the strong coupling regime with a single InGaAs annealed quantum dot. The absolute reflectivity measurement is used to study the characteristics of our device at low and high excitation power. The strong coupling is obtained with a g=16 \mueV coupling strength in a 7.3\mum diameter micropillar, with a cavity spectral width kappa=20.5 \mueV (Q=65 000). The factor of merit of the strong-coupling regime, 4g/kappa=3, is the current state-of-the-art for a quantum dot-micropillar system.

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