Quantitative topographic imaging using a near-field scanning microwave microscope

Details Quantitative topographic imaging using a near-field scanning microwave microscope Quantitative topographic imaging using a near-field scanning microwave microscope

1998-02-12

arxiv.org/abs/cond-mat/9802139v1

Physics

Condensed Matter

Materials Science

Accepted for publication Applied Physics Letters. To appear tentatively 4/6/98

Scientific paper

10.1063/1.121182

We describe a technique for extracting topographic information using a scanning near-field microwave microscope. By monitoring the shift of the system's resonant frequency, we obtain quantitative topographic images of uniformly conducting metal surfaces. At a frequency of 9.572 GHz, our technique allows for a height discrimination of about 55 nm at a separation of 30 microns. We present topographic images of uneven, conducting samples and compare the height response and sensitivity of the system with theoretical expectations.

Affiliated with

Also associated with

No associations

Rating

Quantitative topographic imaging using a near-field scanning microwave microscope does not yet have a rating. At this time, there are no reviews or comments for this scientific paper.

If you have personal experience with Quantitative topographic imaging using a near-field scanning microwave microscope, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Quantitative topographic imaging using a near-field scanning microwave microscope will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFWR-SCP-O-535760