Quantitative analysis of the critical current due to vortex pinning by surface corrugation

Details Quantitative analysis of the critical current due to vortex pinning by surface corrugation Quantitative analysis of the critical current due to vortex pinning by surface corrugation

2004-04-14

arxiv.org/abs/cond-mat/0404332v1

Physics

Condensed Matter

Superconductivity

accepted for publication in Phys Rev B

Scientific paper

10.1103/PhysRevB.69.224504

The transport critical current of a Niobium (Nb) thick film has been measured for a large range of magnetic field. Its value and variation are quantitatively described in the framework of the pinning of vortices due to boundary conditions at the rough surface, with a contact angle well explained by the spectral analysis of the surface roughness. Increasing the surface roughness using a Focused Ion Beam results also in an increase of the superficial critical current.

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