Physics – Condensed Matter – Materials Science
Scientific paper
2005-01-03
Central Eur.J.Phys. 3 (2005) 178-185
Physics
Condensed Matter
Materials Science
16 pages, 5 figures. Accepted for publication with CEJP, with re writes of document pending final Editorial board (of CEJP) fi
Scientific paper
10.2478/BF02475585
We deposited epitaxial thin films of Morphotropic Phase Boundary (MPB) Pb0.65Ba0.35Nb2O6 (PBN:65) on MgO substrates using pulsed laser deposition. Afterwards, a novel transmission optical experiment was developed to measure the electric field-induced bending angle of the thin film sample using a divergent incident light. From which the electric field-induced strain was obtained, and it was used to calculate the electrostrictive constant of the PBN thin film. The result is 0.000875 um2/V2, and it is consistent with what we measured in the reflection experiment.
Walcott Beckwith Andrew
Yang Xi
No associations
LandOfFree
Pulsed Laser Deposition of a PBN:65 Morphotropic Phase Boundary Thin Film with Large Electrostriction does not yet have a rating. At this time, there are no reviews or comments for this scientific paper.
If you have personal experience with Pulsed Laser Deposition of a PBN:65 Morphotropic Phase Boundary Thin Film with Large Electrostriction, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Pulsed Laser Deposition of a PBN:65 Morphotropic Phase Boundary Thin Film with Large Electrostriction will most certainly appreciate the feedback.
Profile ID: LFWR-SCP-O-528937