Probing quantum-mechanical level repulsion in disordered systems by means of time-resolved selectively-excited resonance fluorescence

Details Probing quantum-mechanical level repulsion in disordered systems by means of time-resolved selectively-excited resonance fluorescence Probing quantum-mechanical level repulsion in disordered systems by means of time-resolved selectively-excited resonance fluorescence

2007-01-17

arxiv.org/abs/cond-mat/0701406v1

Phys. Rev. Lett. 98, 087401 (2007)

Physics

Condensed Matter

Disordered Systems and Neural Networks

4 pages, 4 figures, to appear in Phys. Rev. Lett

Scientific paper

10.1103/PhysRevLett.98.087401

We argue that the time-resolved spectrum of selectively-excited resonance fluorescence at low temperature provides a tool for probing the quantum-mechanical level repulsion in the Lifshits tail of the electronic density of states in a wide variety of disordered materials. The technique, based on detecting the fast growth of a fluorescence peak that is red-shifted relative to the excitation frequency, is demonstrated explicitly by simulations on linear Frenkel exciton chains.

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