Preparation of atomically clean and flat Si(100) surfaces by low-energy ion sputtering and low-temperature annealing

Details Preparation of atomically clean and flat Si(100) surfaces by low-energy ion sputtering and low-temperature annealing Preparation of atomically clean and flat Si(100) surfaces by low-energy ion sputtering and low-temperature annealing

2003-06-15

arxiv.org/abs/cond-mat/0306397v1

Physics

Condensed Matter

Materials Science

13 pages, 3 figures, to be published in Applied Surface Science

Scientific paper

10.1016/S0169-4332(03)00826-2

Si(100) surfaces were prepared by wet-chemical etching followed by 0.3-1.5keV Ar ion sputtering, either at elevated or room temperature. After a brief anneal under ultrahigh vacuum conditions, the resulting surfaces were examined by scanning tunneling microscopy. We find that wet-chemical etching alone cannot produce a clean and flat Si(100) surface. However, subsequent 300eV Ar ion sputtering at room temperature followed by a 973K anneal yields atomically clean and flat Si(100) surfaces suitable for nanoscale device fabrication.

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