Polarized resonant inelastic x-ray scattering as an ultra-fine probe of excited states in La2CuO4

Details Polarized resonant inelastic x-ray scattering as an ultra-fine probe of excited states in La2CuO4 Polarized resonant inelastic x-ray scattering as an ultra-fine probe of excited states in La2CuO4

2005-06-24

arxiv.org/abs/cond-mat/0506650v1

Physics

Condensed Matter

Strongly Correlated Electrons

4 pages, 4 pictures

Scientific paper

10.1103/PhysRevLett.96.077006

X-ray absorption is the standard method to probe the unoccupied density of states at a given edge. Here we show that polarized Resonant Inelastic X-Ray Scattering in La2CuO4 at the Cu K-edge is extremely sensitive to the environment of the Cu atom and the fine structure in the Cu 4p density of states. Combined ab initio and many-body cluster calculations, used for the first time in such a context, show remarkable agreement with experiment. In particular we identify a non-local effect namely a transition to off-site Cu 3d states.

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