Polarized Raman spectroscopy of nearly-tetragonal BiFeO$_3$ thin films

Details Polarized Raman spectroscopy of nearly-tetragonal BiFeO$_3$ thin films Polarized Raman spectroscopy of nearly-tetragonal BiFeO$_3$ thin films

2010-03-14

arxiv.org/abs/1003.2828v1

Phys. Rev. B 82, 014107 (2010)

Physics

Condensed Matter

Materials Science

4 pages, 4 figures, 1 table

Scientific paper

BiFeO$_3$ thin films can be epitaxially stabilized in a nearly-tetragonal phase under a high biaxial compressive strain. Here we investigate the polarized Raman spectra of constrained BiFeO$_3$ films with tetragonal-like (BFO-T), rhombohedral-like (BFO-R) and multiphase (BFO-T+R) structure. Based on analysis of the number and symmetry of the Raman lines, we provide strong experimental evidence that the nearly-tetragonal films are monoclinic ($Cc$ symmetry) and not tetragonal $(P4mm)$. Through the Raman mapping technique we show localized coexistence of BFO-T and BFO-R phases with the relative fraction dependent on the film thickness.

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