Polarization dependence and symmetry analysis in indirect K-edge RIXS

Details Polarization dependence and symmetry analysis in indirect K-edge RIXS Polarization dependence and symmetry analysis in indirect K-edge RIXS

2010-03-28

arxiv.org/abs/1003.5348v1

Phys. Rev. B, 82, 035113 (2010)

Physics

Condensed Matter

Superconductivity

10 pages, 4 figures, 2 tables

Scientific paper

10.1103/PhysRevB.82.035113

We present a study of the charge-transfer excitations in undoped Nd2CuO4 using resonant inelastic X-ray scattering (RIXS) at the Cu K-edge. At the Brillouin zone center, azimuthal scans that rotate the incident-photon polarization within the CuO2 planes reveal weak fourfold oscillations. A comparison of spectra taken in different Brillouin zones reveals a spectral weight decrease at high energy loss from forward- to back-scattering. We show that these are scattered-photon polarization effects related to the properties of the observed electronic excitations. Each of the two effects constitutes about 10% of the inelastic signal while the '4p-as-spectator' approximation describes the remaining 80%. Raman selection rules can accurately model our data, and we conclude that the observed polarization-dependent RIXS features correspond to Eg and B1g charge-transfer excitations to non-bonding oxygen 2p bands, above 2.5 eV energy-loss, and to an Eg d->d excitation at 1.65 eV.

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