Physics – Condensed Matter – Materials Science
Scientific paper
2008-05-05
Physics
Condensed Matter
Materials Science
5 pages, 5 figures
Scientific paper
10.1103/PhysRevB.77.245329
We present a novel method to measure transient photovoltage at nanointerfaces using ultrafast electron diffraction. In particular, we report our results on the photoinduced electronic excitations and their ensuing relaxations in a hydroxyl-terminated silicon surface, a standard substrate for fabricating molecular electronics interfaces. The transient surface voltage is determined by observing Coulomb refraction changes induced by the modified space-charge barrier within a selectively probed volume by femtosecond electron pulses. The results are in agreement with ultrafast photoemission studies of surface state charging, suggesting a charge relaxation mechanism closely coupled to the carrier dynamics near the surface that can be described by a drift-diffusion model. This study demonstrates a newly implemented ultrafast diffraction method for investigating interfacial processes, with both charge and structure resolution.
Murdick Ryan A.
Murooka Yoshie
Raman Ramani K.
Ruan Chong-Yu
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