Parametric resonance in atomic force microscopy: A new method to study the tip-surface interaction

Details Parametric resonance in atomic force microscopy: A new method to study the tip-surface interaction Parametric resonance in atomic force microscopy: A new method to study the tip-surface interaction

1997-12-11

arxiv.org/abs/cond-mat/9712120v1

Physics

Condensed Matter

Materials Science

Written in REVTeX, 4 pages, 4 Postscript figures

Scientific paper

We propose a new method to investigate interactions involved in atomic force microscopy (AFM). It is a dynamical method relying on the growth of oscillations via parametric resonance. With this method the second and third derivatives of the tip-surface interaction potential can be measured simultaneously. Because of its threshold behavior parametric resonance AFM leads to sharp contrasts in surface imaging.

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