Optimized conditions for direct imaging of bonding charge density in electron microscopy

Details Optimized conditions for direct imaging of bonding charge density in electron microscopy Optimized conditions for direct imaging of bonding charge density in electron microscopy

2010-08-25

arxiv.org/abs/1008.4291v2

Physics

Condensed Matter

Materials Science

31 pages, including 13 figures

Scientific paper

We report on the observability of valence bonding effects in aberration-corrected high resolution electron microscopy (HREM) images along the [010] projection of the mineral Forsterite(Mg2SiO4). We have also performed exit wave restorations using simulated noisy images and have determined that both the intensities of individual images and the modulus of the restored complex exit wave are most sensitive to bonding effects at a level of 25% for moderately thick samples of 20-25 nm. This relatively large thickness is due to dynamical amplification of bonding contrast arising from partial de-channeling of 1s states.

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