On Using Magnetic and optical methods to determine the size and characteristics of nanoparticles embedded in oxide semiconductors

Details On Using Magnetic and optical methods to determine the size and characteristics of nanoparticles embedded in oxide semiconductors On Using Magnetic and optical methods to determine the size and characteristics of nanoparticles embedded in oxide semiconductors

2010-01-15

arxiv.org/abs/1001.2674v1

Physics

Condensed Matter

Materials Science

Manuscript of poster to be presented at MMM-Intermag 2010. Accepted for publication in Magnetic Trans of IEEE

Scientific paper

Films of oxides doped with transition metals are frequently believed to have
magnetic inclusions. Magnetic methods to determine the amount of nanophases and
their magnetic characteristics are described. The amount of the sample that is
paramagnetic may also be measured. Optical methods are described and shown to
be very powerful to determine which defects are also magnetic.

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