Near millimeter wave characterization of dual mode materials

Details Near millimeter wave characterization of dual mode materials Near millimeter wave characterization of dual mode materials

May 1989

adsabs.harvard.edu/cgi-bin/nph-data_query?bibcode=1989apopt..28.1874s&link_type=abstract

Applied Optics (ISSN 0003-6935), vol. 28, May 15, 1989, p. 1874-1876.

Physics

Optics

Infrared Inspection, Millimeter Waves, Refractivity, Error Analysis, Fourier Transformation, Infrared Interferometers, Polarized Light

Scientific paper

Nine materials which have application to both the millimeter and IR wavelength regions have been analyzed, and their indices of refraction and absorption coefficients have been determined in the 4-18/cm range. The lowest loss materials are found to be ALON and sapphire, and the highest loss samples to be ZnS and ZnSe. The mm-wave indices are all shown to be higher than their corresponding IR indices.

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